Development and Application of Fault Detectability Performance Metrics for Instrument Calibration Verification and Anomaly Detection
J. Wesley Hines, Dustin R. Garvey Cited by 45
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Open Access Archive
2016 vol. 11 no. 1
An Efficient Skew Estimation Technique for Scanned Documents: An Application of Piece-Wise Painting Algorithm
Alireza Alaei, P. Nagabhushan, Umapada Pal, Fumitaka Kimura
The Journal of Pattern Recognition Research (JPRR) provides an international forum for the electronic publication of high-quality research and industrial experience articles in all areas of pattern recognition, machine learning, and artificial intelligence. JPRR is committed to rigorous yet rapid reviewing. Final versions are published electronically (ISSN 1558-884X) immediately upon acceptance.