Development and Application of Fault Detectability Performance Metrics for Instrument Calibration Verification and Anomaly Detection
J. Wesley Hines, Dustin R. Garvey Cited by 45
Alaei Alireza, Université François-Rabelais de Tours
Vol 11, No 1 (2016) - Applications
An Efficient Skew Estimation Technique for Scanned Documents: An Application of Piece-wise Painting Algorithm AbstractPDF