Enhancing Binary Feature Vector Similarity Measures
The Journal of Pattern Recognition Research (JPRR) provides an international forum for the electronic publication of high-quality research and industrial experience articles in all areas of pattern recognition, machine learning, and artificial intelligence. JPRR is committed to rigorous yet rapid reviewing. Final versions are published electronically
(ISSN 1558-884X) immediately upon acceptance.
Enhancing Binary Feature Vector Similarity Measures
Sung-Hyuk Cha, Charles Tappert, Sungsoo Yoon
JPRR Vol 1, No 1 (2006); doi:10.13176/11.20 
Download
Sung-Hyuk Cha, Charles Tappert, Sungsoo Yoon
Abstract
Similarity and dissimilarity measures play an important role in pattern classification and clustering. For a century, researchers have searched for a good measure. Here, we review, categorize, and evaluate various binary vector similarity/dissimilarity measures. One of the most contentious disputes in the similarity measure selection problem is whether the measure includes or excludes negative matches. While inner-product based similarity measures consider only positive matches, other conventional measures credit both positive and negative matches equally. Hence, we propose an enhanced similarity measure that gives variable credits and show that it is superior to conventional measures in iris biometric authentication and offline handwritten character recognition applications. Finally, the proposed similarity measure can be further boosted by applying weights and we demonstrate that it outperforms the weighted Hamming distance.
JPRR Vol 1, No 1 (2006); doi:10.13176/11.20 | Full Text  | Share this paper: