Pattern Similarity Score Based on One Dimensional Time Series Analysis
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Pattern Similarity Score Based on One Dimensional Time Series Analysis
Paawan Sharma, Mukul Kumar Gupta, Amit Kumar Mondal, Vivek Kaundal
JPRR Vol 12, No 1 (2017); doi:10.13176/11.744 
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Paawan Sharma, Mukul Kumar Gupta, Amit Kumar Mondal, Vivek Kaundal
Abstract
A novel procedure to quantify similarity in different images based on time-series analysis is reported. Pattern recognition and matching operation includes parameters such as mean, correlation, mutual information etc. The proposed technique consists of orderly application of various mathematical transformations on one dimensional time series obtained from a 2D image array. These transformations include array to time-series conversion, local maxima detection-joining, and calculation of cumulative angle. The final calculated parameter is a direct pointer to the image similarity. The proposed technique performed well against traditional image comparison techniques under specific circumstances. The technique can be also used to identify similar patterns in a single image. The simulation codes have been written on SCILAB platform.
JPRR Vol 12, No 1 (2017); doi:10.13176/11.744 | Full Text  | Share this paper: